Applied multivariate statistical analysis
Applied multivariate statistical analysis
Testing of analog systems using behavioral models and optimal experimental design techniques
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Measurement selection for parametric IC fault diagnosis
Journal of Electronic Testing: Theory and Applications
Fuzzy optimization models for analog test decisions
Journal of Electronic Testing: Theory and Applications - Special issue on economics of electronic design, manufacture and test
Matrix computations (3rd ed.)
Design of robust test criteria in analog testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
Robust optimization based backtrace method for analog circuits
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Analog test design with IDD measurements for the detection of parametric and catastrophic faults
Proceedings of the conference on Design, automation and test in Europe
Hierarchical ATPG for Analog Circuits and Systems
IEEE Design & Test
Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
7.2 Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Test Metrics for Analog Parametric Faults
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Hierarchical Test Generation for Analog Circuits Using Incremental Test Development
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A Design-Based Structural Test Method for a Switched-Resistor DAC
Journal of Electronic Testing: Theory and Applications
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In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is prohibitive to directly verify the circuit specifications due to the test equipment costs. Our approach considers a given universal set of reasonable input stimuli and measurements that can be performed with the given test equipment. From this universal set, a minimal number of measurements is automatically selected that represent a set of observations characterizing the state of the circuit under test with respect to parametric faults. A parametric fault model is introduced which is related to the individual circuit specifications. For each given circuit specification, a corresponding test inference criterion is computed, based on logistic discrimination analysis. By applying these criteria, the satisfaction or violation of the given circuit specifications can be inferred from the observations of the circuit under test. The COI method applied to a complex operational amplifier yields very encouraging simulated results with respect to parametric faults as well as to catastrophic faults.