Analog test design with IDD measurements for the detection of parametric and catastrophic faults

Authors:
W. M. Lindermeir;T. J. Vogels;H. E. Graeb
Affiliations:
Institute of Electronic Design Automation, Technical University of Munich, Arcisstr. 21, 80333 Munich, Germany;Institute of Electronic Design Automation, Technical University of Munich, Arcisstr. 21, 80333 Munich, Germany;Institute of Electronic Design Automation, Technical University of Munich, Arcisstr. 21, 80333 Munich, Germany
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
1998

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Abstract

Earlier approaches dealt with the detection of catastrophic faults based on IDD monitoring. Consideration of the more subtle parametric faults and the ADC quantization noise, however, is essential for high-quality analog testing. The paper presents a new design method for analog test of parametric and catastrophic faults by IDD monitoring. ADC quantization noise is systematically considered throughout the method. Results prove its effectiveness.