Applied multivariate statistical analysis
Applied multivariate statistical analysis
Introduction to statistical pattern recognition (2nd ed.)
Introduction to statistical pattern recognition (2nd ed.)
Multiple fault analog circuit testing by sensitivity analysis
Analog Integrated Circuits and Signal Processing - Joint special issue on analog and mixed-signal testing.
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Measurement selection for parametric IC fault diagnosis
Journal of Electronic Testing: Theory and Applications
Improving quality: yield versus test coverage
Journal of Electronic Testing: Theory and Applications - Special issue on economics of electronic design, manufacture and test
Design based analog testing by Characteristic Observation Inference
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Matrix computations (3rd ed.)
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Worst-case analysis and optimization of VLSI circuit performances
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Minimal length diagnostic tests for analog circuits using test history
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
Analog test design with IDD measurements for the detection of parametric and catastrophic faults
Proceedings of the conference on Design, automation and test in Europe
| Hi-index | 0.00 |
Test design of analog circuits based on statistical methods for decision making is a topic of growing interest. The major problem of such statistical approaches with respect to industrial applicability concerns the confidence with which the determined test criteria can be applied in production testing. This mainly refers to the consideration of measurement noise, to the selected measurements, as well as to the required training and validation samples. These crucial topics are addressed in this paper. On exploiting experience from the statistical design of analog circuits and from pattern recognition methods, efficient solutions to these problems are provided. A very robust test design is achieved by systematically considering measurement noise, by selecting most significant measurements, and by using most meaningful samples. Moreover, parametric as well as catastrophic faults are covered on application of digital testing methods.