DRAFTS: discretized analog circuit fault simulator
DAC '93 Proceedings of the 30th international Design Automation Conference
Multiple fault analog circuit testing by sensitivity analysis
Journal of Electronic Testing: Theory and Applications - Joint special issue on analog and mixed-signal testing
Analytical fault modeling and static test generation for analog ICs
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Design based analog testing by Characteristic Observation Inference
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Dynamic test signal design for analog ICs
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Design of robust test criteria in analog testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Linear Error Modeling of Analog and Mixed-Signal Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Test Vector Generation for Linear Analog Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Efficient multisine testing of analog circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
Test generation for mixed-signal devices using signal flow graphs
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
CLP-based Multifrequency Test Generation for Analog Circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Coefficient-based parametric faults detection in analog circuits
Proceedings of the 13th ACM Great Lakes symposium on VLSI
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations
Journal of Electronic Testing: Theory and Applications
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing
Journal of Electronic Testing: Theory and Applications
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We describe a newreverse simulation approach to analog and mixed-signal circuit testgeneration that parallels digital test generation. We invert theanalog circuit signal flow graph, reverse simulate it with good andbad machine outputs, and obtain test waveforms and componenttolerances, given circuit output tolerances specified by thefunctional test needs of the designer. The inverted graph allowsbacktracing to justify analog outputs with analog inputsinusoids. Mixed-signal circuits can be tested using this approach,and we present test generation results for two mixed-signal circuitsand four analog circuits, one being a multiple-input, multiple-outputcircuit. This analog backtrace method can generate tests forsecond-order analog circuits and certain non-linear circuits. Thesecannot be handled by existing methods, which lack a fault model and abacktrace method. Our proposed method also defines the necessarytolerances on circuit structural components, in order to keep theoutput circuit signal within the envelope specified by thedesigner. This avoids the problem of overspecifying analog circuitcomponent tolerances, and reduces cost. We prove that our parametricfault tests also detect all catastrophic faults. Unlike priormethods, ours is a structural, rather than functional, analog testgeneration method.