Testing of analog systems using behavioral models and optimal experimental design techniques
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Nyquist data converter testing and yield analysis using behavioral simulation
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Digital detection of analog parametric faults in SC filters
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
Real-Time Current Testing for A/D Converters
IEEE Design & Test
Test generation for mixed-signal devices using signal flow graphs
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
Functional test pattern generation for CMOS operational amplifier
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
A Test Point Insertion Algorithm for Mixed-Signal Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Optimal INL/DNL Testing of A/D Converters Using a Linear Model
ITC '00 Proceedings of the 2000 IEEE International Test Conference
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