Fundamentals of matrix computations
Fundamentals of matrix computations
The Use of Linear Models for the Efficient and Accurate Testing of A/D Converters
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Linear Error Modeling of Analog and Mixed-Signal Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
The Production Implementation of a Linear Error Modeling Technique
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Testing High Speed High Accuracy Analog to Digital Converters Embedded in Systems On a Chip
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Linearity Testing Issues of Analog to Digital Converters
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Fundamentals of Applied Probability Theory
Fundamentals of Applied Probability Theory
Journal of Electronic Testing: Theory and Applications
Lookup table based simulation and statistical modeling of Sigma-Delta ADCs
Proceedings of the 43rd annual Design Automation Conference
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As Analog to Digital Converters continue to improvein resolution, their linearity testing has become increasinglychallenging in terms of test accuracy and test time.In this paper, we present a technique for estimation thelinearity metrics of an ADC that is optimal in terms ofexpected r.m.s error in INL/DNL estimates, for a giventest time. Experimental results measured on an ADC fromindustry to validate the effectiveness of the technique arepresented.