Metrics, techniques and recent developments in mixed-signal testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Matrix computations (3rd ed.)
Incorporation of hard-fault-coverage in model-based testing of mixed-signal ICs
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Industrial Relevance of Analog IFA: A Fact or a Fiction
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Test Generation for Accurate Prediction of Analog Specifications
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Optimal INL/DNL Testing of A/D Converters Using a Linear Model
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Speed-up of High Accurate Analog Test Stimulus Optimization
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing
Journal of Electronic Testing: Theory and Applications
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By their nature, mixed-signal circuits have to be tested for both structural integrity and parametric performance. For the example of data converters we review test pattern selection strategies geared towards structural and performance testing. We introduce a novel test pattern selection strategy that merges both objectives, and by that we achieve a significant reduction in the size of the set of test patterns applied on the production line.