Telecommunications Measurements, Analysis, and Instrumentation
Telecommunications Measurements, Analysis, and Instrumentation
Realistic fault modeling for VLSI testing
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
Economic modeling of board test strategies
Journal of Electronic Testing: Theory and Applications - Special issue on economics of electronic design, manufacture and test
Improving quality: yield versus test coverage
Journal of Electronic Testing: Theory and Applications - Special issue on economics of electronic design, manufacture and test
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits
Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits
A Bulti-in Self-Test Strategy for Wireless Communication Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Industrial Relevance of Analog IFA: A Fact or a Fiction
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
An Integration of Memory-Based Analog Signal Generation into Current DFT Architectures
Proceedings of the IEEE International Test Conference on Test and Design Validity
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Journal of Electronic Testing: Theory and Applications
ON-CHIP MEASUREMENT OF THE JITTER TRANSFER FUNCTION OF CHARGE-PUMP PHASE-LOCKED LOOPS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Highly Digital, Low-Cost Design of Statistic Signal Acquisition in SoCs
Proceedings of the conference on Design, automation and test in Europe - Volume 3
Mixed Signal DFT: A Concise Overview
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
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This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. We begin by first outlining the role of test in a manufacturing environment, and its impact on product cost and quality. We look at the impact of manufacturing defects on the behavior of digital and analog circuits. Subsequently, we argue that analog circuits require very different test methods than those presently used to test digital circuits. We then describe four common analog test methods and their measurement setups. We also describe how analog testing can be accomplished using digital sampling techniques. Finally, we close this tutorial with a brief description of several developments presently underway on the design of testable mixed-signal circuits.