Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits

Metrics, techniques and recent developments in mixed-signal testing

Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design

Implementation of a linear histogram BIST for ADCs

Proceedings of the conference on Design, automation and test in Europe

A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs

Journal of Electronic Testing: Theory and Applications

Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST

Journal of Electronic Testing: Theory and Applications

Test and Testability of a Monolithic MEMS for Magnetic Field Sensing

Journal of Electronic Testing: Theory and Applications

Testing Mixed-Signal Cores: A Practical Oscillation-Based Test in an Analog Macrocell

IEEE Design & Test

Built-in self-test methodology for A/D converters

EDTC '97 Proceedings of the 1997 European conference on Design and Test

Towards an ADC BIST Scheme Using the Histogram Test Technique

ETW '00 Proceedings of the IEEE European Test Workshop

On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST

Journal of Electronic Testing: Theory and Applications

RF-BIST: Loopback Spectral Signature Analysis

DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

Functionally Fault-tolerant DSP Microprocessor using Sigma---delta Modulated Signals

Journal of Electronic Testing: Theory and Applications

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability