DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits
Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits
An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Proceedings of the IEEE International Test Conference
Built-in self-test methodology for A/D converters
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Towards an ADC BIST Scheme Using the Histogram Test Technique
ETW '00 Proceedings of the IEEE European Test Workshop
Hardware Resource Minimization for Histogram-Based ADC BIST
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
A Low-Cost Adaptive Ramp Generator for Analog BIST Applications
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Auto-Calibrating Analog Timer for On-Chip Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Analog Integrated Circuits and Signal Processing
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In the context of analog BIST for ADC, this paper presents two structures for the internal generation of a linear signal used with the histogram-based test technique. All of these structures use wide-swing current mirrors and an original adaptive system to make the generators less sensitive to process variations. The first structure allows us to generate high quality ramp signal. In a second step, a very high accuracy triangle-wave signal generator is presented in order to improve the equivalent linearity of the generated analog test signal.