DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits
Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits
A Signature Analyzer for Analog and Mixed-signal Circuits
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
Proceedings of the IEEE International Test Conference
A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Built-in self-test methodology for A/D converters
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Hardware Resource Minimization for Histogram-Based ADC BIST
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Highly Digital, Low-Cost Design of Statistic Signal Acquisition in SoCs
Proceedings of the conference on Design, automation and test in Europe - Volume 3
A codesign tool to validate and improve an FPGA based test strategy for high resolution audio ADC
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Low Cost BIST for Static and Dynamic Testing of ADCs
Journal of Electronic Testing: Theory and Applications
Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
IEICE - Transactions on Information and Systems
A Built-in-Self-Test Σ-Δ ADC Prototype
Journal of Electronic Testing: Theory and Applications
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Low-cost digital detection of parametric faults in cascaded ΣΔ modulators
IEEE Transactions on Circuits and Systems Part I: Regular Papers
A robust ADC code hit counting technique
Proceedings of the Conference on Design, Automation and Test in Europe
ΔΣ modulation based on-chip ramp generator for ADC BIST
CONTROL'05 Proceedings of the 2005 WSEAS international conference on Dynamical systems and control
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics
Journal of Electronic Testing: Theory and Applications
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