Metrics, techniques and recent developments in mixed-signal testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
A Nonlinear Noise-Shaping Delta-Sigma Modulator with On-Chip Reinforcement Learning^{*}
Analog Integrated Circuits and Signal Processing - Special issue on Learning on Silicon
A VHDL-based methodology for the design and verification of pipeline A/D converters
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Implementation of a linear histogram BIST for ADCs
Proceedings of the conference on Design, automation and test in Europe
Optimal design of delta-sigma ADCs by design space exploration
Proceedings of the 39th annual Design Automation Conference
Random Data: Analysis and Measurement Procedures
Random Data: Analysis and Measurement Procedures
Proceedings of the 40th annual Design Automation Conference
A Noise Generator for Analog-to-Digital Converter Testing
Proceedings of the 15th symposium on Integrated circuits and systems design
A theory of nonsubtractive dither
IEEE Transactions on Signal Processing
On simple oversampled A/D conversion in L2(R)
IEEE Transactions on Information Theory
| Hi-index | 0.00 |
Presently, the gap between analog and digital processes is ever increasing. Although digital circuits are still obeying Moore麓s law, their analog counterparts follow far behind. Since signal acquisition, through ADC circuits is an often required feature, for many embedded applications the benefits of Moore麓s law have not been achieved. This paper presents our approach to take advantage of the increasing integration of technology for analog interfacing in SoC's, by converting the statistics of the signal. Digital self-tuning of the threshold levels, the use of less expensive and highly variable analog blocks, and stochastic convergence of resolution allow a robust acquisition process. We present the mathematics behind the approach, as well as a set of target applications and experimental results validating the concept.