Pseudo-random testing and signature analysis for mixed-signal circuits
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
ABILBO: Analog BuILt-in Block Observer
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Implementation of a linear histogram BIST for ADCs
Proceedings of the conference on Design, automation and test in Europe
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs
Journal of Electronic Testing: Theory and Applications
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST
Journal of Electronic Testing: Theory and Applications
On-chip analog output response compaction
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Towards an ADC BIST Scheme Using the Histogram Test Technique
ETW '00 Proceedings of the IEEE European Test Workshop
Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A codesign tool to validate and improve an FPGA based test strategy for high resolution audio ADC
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Low Cost BIST for Static and Dynamic Testing of ADCs
Journal of Electronic Testing: Theory and Applications
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics
Journal of Electronic Testing: Theory and Applications
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