A Signature Analyzer for Analog and Mixed-signal Circuits
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
A design-for-test structure for optimising analogue and mixed signal IC test
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Efficient multisine testing of analog circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
Frequency-based BIST for analog circuit testing
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Reuse of existing resources for analog BIST of a switch capacitor filter.
DATE '00 Proceedings of the conference on Design, automation and test in Europe
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST
SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks
Journal of Electronic Testing: Theory and Applications
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This paper presents a novel multifunctional test structure called Analog BuILt-in Block Observer (ABILBO). This structure is based on analog integrators and achieves analog scan, test frequency generation and test response compaction. A high fault coverage was obtained by using a discrete switched-capacitor ABILBO for testing a biquad filter. The ABILBO area overhead and performance penalty can be very low if functional and testing circuitry are shared. This is typically the case of high order filters based on a cascade of biquads.