Optimal ordering of analog integrated circuit tests to minimize test time
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
ABILBO: Analog BuILt-in Block Observer
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
Reuse of existing resources for analog BIST of a switch capacitor filter.
DATE '00 Proceedings of the conference on Design, automation and test in Europe
The ΣΔ-BIST Method Applied to Analog Filters
Journal of Electronic Testing: Theory and Applications
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An efficient method has been developed for generating test waveforms for linear analog circuits which minimize the test effort and maximize the test confidence. The method makes use of a fault-based automatic test pattern generator (ATPG) to generate a set of test frequencies. A successive gradient method is used to combine these individual sinusoidal signals in a way that maximizes the fault coverage. The compressed waveform can be stored on-chip and used for built-in test of analog circuits.