Efficient analog test methodology based on adaptive algorithms
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This paper describes the ΣΔ-BIST method, defined as an analog BIST circuit in the context of mixed signal systems. The test procedure is based on the reuse of existing analog circuits configured as sigma-delta modulators in the analog domain. The test procedure reuses most of existing blocks in a mixed signal system, and thus has small area overhead. Test sensitivity is very high, detecting small component deviations. Moreover, the proposed test technique can be applied to continuous or sampled time circuits, and the test procedure can be developed in the field. The paper explains the method and presents practical results to validate the proposed approach.