The ΣΔ-BIST Method Applied to Analog Filters
Journal of Electronic Testing: Theory and Applications
Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme
Journal of Electronic Testing: Theory and Applications
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Mixed-Signal Circuit Classification in a Pseudorandom Testing Scheme
IOLTW '01 Proceedings of the Seventh International On-Line Testing Workshop
On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing
ITC '04 Proceedings of the International Test Conference on International Test Conference
On-chip measurement of waveforms in mixed-signal circuits using a segmented subsampling technique
Analog Integrated Circuits and Signal Processing
| Hi-index | 0.00 |
This paper proposes a new impulse stimulation and response sampling technique for the implementation of a Built-In Self Test of linear analog integrated circuits embedded in mixed-signal systems. The testing technique is the monitoring of physical fault influences on impulse response characteristics through the use of single-point sampling method and window criterions. The implementation of BIST system realizes a controllable impulse generator, which provide two short impulses simultaneously for stimulating a Circuit-Under-Test, and sampling a transient impulse response. This proposed technique is cost-effective and relatively compact. Neither high-precision analog test stimuli with fault-free bit streams nor characterization and synchronization processes in DSP are required. Demonstrations of the BIST system for a Sallen-Key low-pass filter in a physical level using 0.18-μm CMOS technology show a low area overhead of 11.19%, and offer high catastrophic and parameter fault coverage of 98.24%.