Pseudo-random testing and signature analysis for mixed-signal circuits
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Pseudorandom testing for mixed-signal circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Probabilistic fault detection and the selection of measurements for analog integrated circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Minimizing production test time to detect faults in analog circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 40th annual Design Automation Conference
Pseudo-Random Sequence Based Tuning System for Continuous-Time Filters
Proceedings of the conference on Design, automation and test in Europe - Volume 1
An Approach to the Classification of Mixed-Signal Circuits in a Pseudorandom Testing Scheme
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Experimental validation of a tuning algorithm for high-speed filters
Proceedings of the conference on Design, automation and test in Europe
Wavelet based fault detection in analog VLSI circuits using neural networks
Applied Soft Computing
Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes
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Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods, especially in a BIST structure. To fully exploit these advantages a suitable choice of the pseudo-random input parameters should be done and an investigation on the accuracy of the circuit response samples needed to reduce the risk of misclassification should be carried out. Here these issues have been addressed for a testing scheme based on the estimation of the impulse response of the device under test (DUT) by means of input-output cross-correlation. Moreover, new acceptance criteria for the DUT are suggested which solve some ambiguity problems arising if the classification of the DUT as good or bad is based on a few samples of the cross-correlation function. Examples of application of the proposed techniques to real cases are also shown in order to assess the impact of the measurement system inaccuracies on the reliability of the test.