ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme
Journal of Electronic Testing: Theory and Applications
An Approach to the Classification of Mixed-Signal Circuits in a Pseudorandom Testing Scheme
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Fault analysis and simulation of large scale industrial mixed-signal circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Multidimensional analog test metrics estimation using extreme value theory and statistical blockade
Proceedings of the 50th Annual Design Automation Conference
Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Analog testing is a difficult task without a clearcut methodology. Analog circuits are tested for satisfying their specifications, not for faults. Given the high cost of testing analog specifications, it is proposed that tests for analog circuits should be designed to detect faults. Therefore analog fault modeling is discussed. Based on an analysis of the types of tests needed for different types of faults, algorithms for fault-driven test set selection are presented. A major reduction in testing time should come from reducing the number of specification tests that need to be performed. Hence algorithms are presented for minimizing specification testing time. After specification testing time is minimized, the resulting test sets are supplemented with some simple, possibly non-specification, tests to achieve 100% fault coverage. Examples indicate that fault-driven test set development can lead to drastic reductions in production testing time