Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling

Authors:
P. N. Variyam;A. Chatterjeee;N. Nagi
Affiliations:
-;-;-
Venue:
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Year:
1997

Citing 0
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Abstract

In this paper an efficient low-cost built-in self test (BIST) scheme is proposed for analog circuits. The key idea is to use rectangular pulses of random widths obtained directly from a digital linear feedback shift register to perform transient testing of the circuit under test. A small amount of synchronization and comparison circuitry is necessary to perform the BIST. A methodology for designing the BIST hardware is described and results are discussed. The method is seen to be both efficient and low cost.