LFSR-based BIST for analog circuits using slope detection

Authors:
Hongjoong Shin;Hak-soo Yu;Jacob A. Abraham
Affiliations:
The University of Texas at Austin, Austin, TX;The University of Texas at Austin, Austin, TX;The University of Texas at Austin, Austin, TX
Venue:
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Year:
2004

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Abstract

This paper presents a new analog BIST scheme using a slope detection technique. In test mode, a circuit under test (CUT) is stimulated with a periodic rectangular pulse generated from a Linear Feed-Back Shift Register (LFSR) and a periodic invariant response is generated. The width of the pulse is a BIST parameter to allow a trade-off between test time and fault coverage. In order to maximize fault coverage and minimize the hardware overhead, we propose a slope detection technique which analyzes the response of CUT using a counter and a simple digital gate. Simulation results are presented to show the feasibility of this scheme.