Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling

Fault Detection and Automated Fault Diagnosis for Embedded Integrated Electrical Passives

Journal of VLSI Signal Processing Systems - Special issue on system level design

Parametric fault simulation and test vector generation

DATE '00 Proceedings of the conference on Design, automation and test in Europe

Fault Simulation for Analog Circuits Under Parameter Variations

Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999

Test generation based diagnosis of device parameters for analog circuits

Proceedings of the conference on Design, automation and test in Europe

Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuits

Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design

Analog Testing with Time Response Parameters

IEEE Design & Test

DC Built-In Self-Test for Linear Analog Circuits

IEEE Design & Test

Automated System-Level Test Development for Mixed-Signal Circuits

Analog Integrated Circuits and Signal Processing

Automatic test vector generation for mixed-signal circuits

EDTC '95 Proceedings of the 1995 European conference on Design and Test

Optimal Design of Checksum-Based Checkers for Fault Detection in Linear Analog Circuits

VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications

A Path Sensitization Technique for Testing of Switched Capacitor Circuits

VLSID '03 Proceedings of the 16th International Conference on VLSI Design

Extension of Inductive Fault Analysis to Parametric Faults in Analog Circuits with Application to Test Generation

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

CLP-based Multifrequency Test Generation for Analog Circuits

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

Specification Back-Propagation and Its Application to DC Fault Simulation for Analog/Mixed-Signal Circuits

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Speed-up of High Accurate Analog Test Stimulus Optimization

ITC '99 Proceedings of the 1999 IEEE International Test Conference

LFSR-based BIST for analog circuits using slope detection

Proceedings of the 14th ACM Great Lakes symposium on VLSI

Design of concurrent test hardware for linear analog circuits with constrained hardware overhead

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters

Journal of Electronic Testing: Theory and Applications

Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits

ICCD '05 Proceedings of the 2005 International Conference on Computer Design

Hierarchical analysis of process variation for mixed-signal systems

Proceedings of the 2005 Asia and South Pacific Design Automation Conference

Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions

ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design

Re-configuration of sub-blocks for effective application of time domain tests

Proceedings of the conference on Design, automation and test in Europe

Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing

Journal of Electronic Testing: Theory and Applications

Analytical modelling of parameter fluctuations with applications to analogue VLSI circuits and systems

ICOSSSE'05 Proceedings of the 4th WSEAS/IASME international conference on System science and simulation in engineering

Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation

Journal of Electronic Testing: Theory and Applications