Multiple fault analog circuit testing by sensitivity analysis
Analog Integrated Circuits and Signal Processing - Joint special issue on analog and mixed-signal testing.
A digital method for testing embedded switched capacitor filters
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Optimal test-set generation for parametric fault detection in switched capacitor filters
ATS '00 Proceedings of the 9th Asian Test Symposium
Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test
ARVLSI '99 Proceedings of the 20th Anniversary Conference on Advanced Research in VLSI
Test generation for mixed-signal devices using signal flow graphs
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Hierarchical Test Generation for Analog Circuits Using Incremental Test Development
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
DFT for digital detection of analog parametric faults in SC filters
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Complex oscillation-based test and its application to analog filters
IEEE Transactions on Circuits and Systems Part I: Regular Papers - Special issue on ISCAS 2009
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In this work we describe a new method for testingof Switched Capacitor (SC) circuits based on modelingthe circuit as a charge transfer graph. Based on thedifferences between the graphs of good and faulty circuit, one or more paths are identified such that upontheir sensitization the difference in output voltage ofthe good and faulty circuits becomes appreciable. Thevalidity of the proposed technique is demonstrated usingthe examples of SC lossy integrator, voltage amplifierand biquad filter circuits. It is shown that the proposedtechnique is efficient in testing both atastrophic as wellas parametric faults in the apacitors.