Analytical fault modeling and static test generation for analog ICs
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
A formal approach to nonlinear analog circuit verification
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits
Proceedings of the IEEE International Test Conference on Test and Design Validity
Test Vector Generation for Linear Analog Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Test generation for mixed-signal devices using signal flow graphs
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
Automated test pattern generation for analog integrated circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Verification of transient response of linear analog circuits
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
IEEE Transactions on Computers
A Path Sensitization Technique for Testing of Switched Capacitor Circuits
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Hierarchical Test Generation for Analog Circuits Using Incremental Test Development
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
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This paper describes a new approach for backtracing analog signals in a circuit. The process of backtracing involves finding the input signal to an analog circuit, from knowledge of its input-output behavior and the desired output signal. While previous approaches rely on the transformation of nodal equations of the circuit to accomplish backtrace, the proposed approach derives the input signal using feedback and forward simulation of a modified circuit. Hence any commercial circuit simulator can be used to the implement the backtrace function. DC convergence conditions for the proposed backtrace approach are derived and it is shown that in the absence of hard nonlinearities, the proposed approach converges to the final solution at a quadratic rate. Application of the backtrace approach to DC verification and test of analog circuits is discussed.