DRAFTS: discretized analog circuit fault simulator
DAC '93 Proceedings of the 30th international Design Automation Conference
Multiple fault analog circuit testing by sensitivity analysis
Journal of Electronic Testing: Theory and Applications - Joint special issue on analog and mixed-signal testing
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Linear Error Modeling of Analog and Mixed-Signal Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Fault Diagnosis of Flash ADC using DNL Test
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
IEEE Transactions on Computers
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
Robust optimization based backtrace method for analog circuits
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Effect of Noise on Analog Circuit Testing
Journal of Electronic Testing: Theory and Applications
Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test
ARVLSI '99 Proceedings of the 20th Anniversary Conference on Advanced Research in VLSI
A Path Sensitization Technique for Testing of Switched Capacitor Circuits
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
7.3 Effect of Noise on Analog Circuit Testing
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Hierarchical Test Generation for Analog Circuits Using Incremental Test Development
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Polynomial coefficient based DC testing of non-linear analog circuits
Proceedings of the 19th ACM Great Lakes symposium on VLSI
| Hi-index | 0.00 |
We describe a new reverse simulation approach to analog and mixed-circuit test generation that parallels the digital test generation process. We invert the signal flow graph of the analog circuit, reverse simulate it with good and bad machine outputs, and obtain component tolerances, given circuit output tolerances. The inverted graph lets us backtrace from analog outputs to get analog input sinusoids that justify them. Mixed-signal circuits are easily tested using this approach, and we present test generation results for three analog circuits and two mixed-signal circuits. This analog backtrace method can generate tests for high-order analog circuits and non-linear circuits, which cannot be handled by existing methods because they lack a fault model and a backtrace method.