Analytical fault modeling and static test generation for analog ICs
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
A comprehensive fault macromodel for opamps
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Metrics, techniques and recent developments in mixed-signal testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Fault Modeling and Simulation Using VHDL-AMS
Analog Integrated Circuits and Signal Processing - Special issue: Analog VHDL
Journal of Electronic Testing: Theory and Applications
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
An approach to realistic fault prediction and layout design for testability in analog circuits
Proceedings of the conference on Design, automation and test in Europe
Effect of Noise on Analog Circuit Testing
Journal of Electronic Testing: Theory and Applications
Structural Fault Based Specification Reduction for Testing Analog Circuits
Journal of Electronic Testing: Theory and Applications
Defect-oriented testing of mixed-signal ICs: some industrial experience
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect-oriented test methodology for complex mixed-signal circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Automatic test vector generation for mixed-signal circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Exploit Analog IFA to Improve Specification Based Tests
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Analogue Fault Modelling and Simulation for Supply Current Monitoring
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Test generation for mixed-signal devices using signal flow graphs
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
7.3 Effect of Noise on Analog Circuit Testing
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Fault Macromodeling for Analog/Mixed-Signal Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
An operational amplifier model for evaluating test strategies at behavioural level
Microelectronics Journal
Defect-based test optimization for analog/RF circuits for near-zero DPPM applications
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Automated model generation algorithm for high-level fault modeling
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Analogue fault simulation based on layout dependent fault models
ITC'94 Proceedings of the 1994 international conference on Test
Fault analysis and simulation of large scale industrial mixed-signal circuits
Proceedings of the Conference on Design, Automation and Test in Europe
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