DRAFTS: discretized analog circuit fault simulator
DAC '93 Proceedings of the 30th international Design Automation Conference
Multiple fault analog circuit testing by sensitivity analysis
Journal of Electronic Testing: Theory and Applications - Joint special issue on analog and mixed-signal testing
Analytical fault modeling and static test generation for analog ICs
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Mixed-signal switching noise analysis using Voronoi-tessellated substrate macromodels
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Analysis and Design of Analog Integrated Circuits
Analysis and Design of Analog Integrated Circuits
Virtual Test of Noise and Jitter Parameters
Proceedings of the IEEE International Test Conference on Test and Design Validity
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Test generation for mixed-signal devices using signal flow graphs
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
| Hi-index | 0.00 |
The effect of test environment noise (tester noise) on testwaveforms is considered. We show that tests generated ignoring thetester noise characteristics are prone to failure when actuallyapplied to the circuit-under-test (CUT). The failure may result inthe good circuit being declared faulty or the faulty circuit beingdeclared good. This failure is independent of the fault model andnature of the test, i.e., AC or DC, time domain or frequency domain.We characterize the total noise at the primary outputs (PO‘s) of thecircuit using second order statistics. We use the noise powerspectrum and root mean square (RMS) values to make decisions aboutthe test waveforms and recommend more noise-robust tests. Fornon-linear circuits we use the Central Limit Theorem of statistics toapproximate narrow band noise at a primary input (PI) by a sum ofsinusoidal distributions, and we use Monte-Carlo simulations todetermine the noise at the PO‘s in the time domain. Results ofexperiments on an instrumentation amplifier, a biquadratic filter,and a Gilbert multiplier are presented, which prove that valid testsin a noise-free environment are invalid when tester noise isconsidered.