Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
A comprehensive fault macromodel for opamps
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Rapid frequency-domain analog fault simulation under parameter tolerances
DAC '97 Proceedings of the 34th annual Design Automation Conference
CONCERT: a concurrent transient fault simulator for nonlinear analog circuits
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
A method to diagnose faults in linear analog circuits using an adaptive tester
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
Effect of Noise on Analog Circuit Testing
Journal of Electronic Testing: Theory and Applications
Fault Diagnosis for Linear Analog Circuits
Journal of Electronic Testing: Theory and Applications
Analog Testing with Time Response Parameters
IEEE Design & Test
Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Test generation for mixed-signal devices using signal flow graphs
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
7.3 Effect of Noise on Analog Circuit Testing
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Fault Macromodeling for Analog/Mixed-Signal Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Analog Transient Concurrent Fault Simulation with Dynamic Fault Grouping
ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
| Hi-index | 0.00 |