Rapid frequency-domain analog fault simulation under parameter tolerances

Authors:
Michael W. Tian;C.-J. Richard Shi
Affiliations:
Department of Electrical and Computer Engineering, University of Iowa, Iowa City, Iowa;Department of Electrical and Computer Engineering, University of Iowa, Iowa City, Iowa
Venue:
DAC '97 Proceedings of the 34th annual Design Automation Conference
Year:
1997

Citing 12
Cited 8

Bounding the solution of interval linear equations

SIAM Journal on Numerical Analysis
DRAFTS: discretized analog circuit fault simulator

DAC '93 Proceedings of the 30th international Design Automation Conference
Built-in self-test and fault diagnosis of fully differential analogue circuits

ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Testing of analog systems using behavioral models and optimal experimental design techniques

ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
System-level design for test of fully differential analog circuits

DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Synthesis tools for mixed-signal ICs: progress on frontend and backend strategies

DAC '96 Proceedings of the 33rd annual Design Automation Conference
Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis

ACM Transactions on Design Automation of Electronic Systems (TODAES)
Computer Methods for Circuit Analysis and Design

Computer Methods for Circuit Analysis and Design
Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs

Proceedings of the IEEE International Test Conference on Test and Design Validity
Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits

EDTC '95 Proceedings of the 1995 European conference on Design and Test
Achieving simulation-based test program verification and fault simulation capabilities for mixed-signal systems

EDTC '95 Proceedings of the 1995 European conference on Design and Test
Optimal testing of VLSI analog circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

CONCERT: a concurrent transient fault simulator for nonlinear analog circuits

Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Behavioral Level Noise Modeling and Jitter Simulation ofPhase-Locked Loops with Faults Using VHDL-AMS

Journal of Electronic Testing: Theory and Applications
Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis

ACM Transactions on Design Automation of Electronic Systems (TODAES)
Efficient DC fault simulation of nonlinear analog circuits

Proceedings of the conference on Design, automation and test in Europe
7.1 Nonlinear Analog DC Fault Simulation by One-Step Relaxation

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Analog Transient Concurrent Fault Simulation with Dynamic Fault Grouping

ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
Hierarchical analysis of process variation for mixed-signal systems

Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation

Journal of Electronic Testing: Theory and Applications

Quantified Score

Hi-index	0.00

Visualization

Abstract

Fault-driven analog and mixed-signal testing calls for rapid fault simulationtechniques. A problem that has not been addressed effectivelyby existing research is that circuit parameters have tolerance ranges.In this paper, we propose representing parameters under variations asintervals, and present an efficient algorithm - based on interval analysisand Householder's formula - to compute the worst-case responsebounds of good and faulty linear(ized) circuits under parameter variations.Our approach takes CPU time comparable to one nominal circuitsimulation, and always produces correct and conservative results. Thealgorithm has been implemented into SPICE3F5. Experimental resultsshow an acceptable accuracy.