Empirical model-building and response surface
Empirical model-building and response surface
Cutting the high cost of testing
IEEE Spectrum
Sequential logic testing and verification
Sequential logic testing and verification
A review of some exchange algorithms for constructing discrete D-optimal designs
Computational Statistics & Data Analysis - Second special issue on optimization techniques in statistics
`` Direct Search'' Solution of Numerical and Statistical Problems
Journal of the ACM (JACM)
Linear Error Modeling of Analog and Mixed-Signal Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Design based analog testing by Characteristic Observation Inference
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Rapid frequency-domain analog fault simulation under parameter tolerances
DAC '97 Proceedings of the 34th annual Design Automation Conference
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Automated test pattern generation for analog integrated circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
An approach to linear model-based testing for nonlinear cascaded mixed-signal systems
Proceedings of the Conference on Design, Automation and Test in Europe
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This paper describes a new CAD algorithm which performs automatic test pattern generation (ATPG) for a general class of analog systems, namely those circuits which can be efficiently modeled as an additive combination of user-defined basis functions. The algorithm is based on the statistical technique of I-optimal experimental design, in which test vectors are chosen to be maximally independent so that circuit performance will be characterized as accurately as possible in the presence of measurement noise and model inaccuracies. This technique allows analog systems to be characterized more accurately and more efficiently, thereby significantly reducing system test time and hence total manufacturing cost.