Testing of analog systems using behavioral models and optimal experimental design techniques
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
Linear Model-Based Error Identification and Calibration for Data Converters
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Test Point Selections for a Programmable Gain Amplifier Using NIST and Wavelet Transform Methods
ATS '07 Proceedings of the 16th Asian Test Symposium
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing
Journal of Electronic Testing: Theory and Applications
An approach to model-based testing of mixed-signal SiPs
IMS3TW '08 Proceedings of the 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop
Test set selection for structural faults in analog IC's
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Linear Model-based Test and Diagnosis (MbT&D) has been successfully applied to single-block modules like Digital-to-Analog Converters (DACs) with a static non-linear transfer characteristic. For Multi-block modules, a diagnosis methodology is needed that can deal with cascades of several linear and nonlinear blocks. In contrast to non-linear methods, linear MbT&D methods only require matrix operations associated with relatively low computational effort. A modification of the linear MbT&D in combination with Volterra series is presented that can be applied to cascaded non-linear systems, for example, a DAC followed by a low-pass filter. A simultaneous identification of numerous frequency domain Volterra kernels is enabled, and thus, to test the compliance to data sheet specifications.