Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing
Journal of Electronic Testing: Theory and Applications
An approach to linear model-based testing for nonlinear cascaded mixed-signal systems
Proceedings of the Conference on Design, Automation and Test in Europe
Optimum selection of capacitive array for multibit Sigma-Delta modulators without DEM
Analog Integrated Circuits and Signal Processing
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For the example of a 12-bit Nyquist-rate ADC, a model for nonlinearity-causing mechanisms is developed based on circuit simulations. The model is used to estimate circuit element values from measured device characteristics. Post-manufacture reconfiguration of the digital control part of the device-type that is used as a test vehicle in this work can improve the linearity performance of a device. An algorithm is proposed that searches for a locally-optimal reconfiguration based on the determined circuit element values. Applying calibration to the circuit simulation model allows one to estimate the performance improvement obtainable with the proposed calibration scheme for a given manufacturing process prior to a physical implementation.