DRAFTS: discretized analog circuit fault simulator
DAC '93 Proceedings of the 30th international Design Automation Conference
Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Analysis and Design of Analog Integrated Circuits
Analysis and Design of Analog Integrated Circuits
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Journal of Electronic Testing: Theory and Applications
Digital detection of analog parametric faults in SC filters
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Fault Models and Test Generation for OpAmp Circuits—The FFM
Journal of Electronic Testing: Theory and Applications
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Fault Macromodeling for Analog/Mixed-Signal Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
An operational amplifier model for evaluating test strategies at behavioural level
Microelectronics Journal
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In this paper, a comprehensive macromodel for transistor level faults in an operational amplifier is developed. With the observation that faulty behavior at output may result from interfacing error in addition to the faulty component, parameters associated with input and output characteristics are incorporated. Test generation and fault classification are addressed for stand-alone opamps. A high fault coverage is achieved by a proposed testing strategy. Transistor level short/bridging faults are analyzed and classified into catastrophic faults and parametric faults. Based on the macromodels for parametric faults, faults simulation is performed for an active filter. We found many parametric faults in the active filter cannot be detected by traditional functional testing. A DFT scheme alone with a current testing strategy to improve fault coverage is proposed.