Mixed-signal switching noise analysis using Voronoi-tessellated substrate macromodels

  • Authors:
  • Ivan L. Wemple;Andrew T. Yang

  • Affiliations:
  • Department of Electrical Engineering, University of Washington;Department of Electrical Engineering, University of Washington

  • Venue:
  • DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
  • Year:
  • 1995

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Abstract