A realistic defect oriented testability methodology for analog circuits
Journal of Electronic Testing: Theory and Applications
Catastrophic Defects Oriented Testability Analysis of a Class AB Amplifier
Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Industrial Relevance of Analog IFA: A Fact or a Fiction
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Bridging Defects Resistance Measurements in a CMOS Process
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Exploit Analog IFA to Improve Specification Based Tests
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Test Evaluation and Data on Defect-Oriented BIST Architecture for High-Speed PLL
ITC '01 Proceedings of the 2001 IEEE International Test Conference
CMOS blocks for on-chip RF test
Analog Integrated Circuits and Signal Processing
A built-in-test circuit for RF differential low noise amplifiers
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Built-in loopback test for IC RF transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Some of Philips' industrial experience arepresented in this paper on defect-oriented testing ofmixed-signal ICs. Case studies on analog circuit blocks intwo automotive mixed-signal ICs are described. This isdone to demonstrate the potential of the defect-orientedtesting approach in the industrial test development for testcoverage improvement with simple industrial tests. It hasbeen shown that, in addition to the conventional function-orientedtests, the test coverage of bridging faults can besignificantly improved by some simple tests derived byusing the defect-oriented testing approach.