Closing the gap between analog and digital
Proceedings of the 37th Annual Design Automation Conference
Parametric fault simulation and test vector generation
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Defect-oriented testing of mixed-signal ICs: some industrial experience
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Exploit Analog IFA to Improve Specification Based Tests
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Compact structural test generation for analog macros
EDTC '97 Proceedings of the 1997 European conference on Design and Test
17.2 A Design for Testability Study on a High Performance Automatic Gain Control Circuit
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Test Evaluation and Data on Defect-Oriented BIST Architecture for High-Speed PLL
ITC '01 Proceedings of the 2001 IEEE International Test Conference
The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach
Journal of Electronic Testing: Theory and Applications
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