Fault simulation of linear analog circuits
Analog Integrated Circuits and Signal Processing - Joint special issue on analog and mixed-signal testing.
A realistic defect oriented testability methodology for analog circuits
Journal of Electronic Testing: Theory and Applications
Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A perturbation based fault modeling and simulation for mixed-signal circuits
ATS '97 Proceedings of the 6th Asian Test Symposium
Analytical device modeling for MOS analog IC's based on regularization and Bayesian estimation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Automated System-Level Test Development for Mixed-Signal Circuits
Analog Integrated Circuits and Signal Processing
Monte Carlo-Alternative Probabilistic Simulations for Analog Systems
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Journal of Electronic Testing: Theory and Applications
Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing
Journal of Electronic Testing: Theory and Applications
Analog automatic test pattern generation for quasi-static structural test
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hierarchical parametric test metrics estimation: a ΣΔ converter BIST case study
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Scalable and efficient analog parametric fault identification
Proceedings of the International Conference on Computer-Aided Design
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