Integrated Design and Test of Mixed-Signal Circuits
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Closing the gap between analog and digital
Proceedings of the 37th Annual Design Automation Conference
A fault simulation methodology for MEMS
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Parametric fault simulation and test vector generation
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Fault Simulation for Analog Circuits Under Parameter Variations
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Speed-up of High Accurate Analog Test Stimulus Optimization
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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The areas of analog circuit fault simulation and test generation have not witnessed the same degree of success as their digital counterparts. This is due mainly to the complexity of analog behavior and the lack of a fault mode. We present a new functional fault modeling technique called the perturbation fault model. The perturbation fault model is based on an estimation of the distance between the responses of the faulty and fault-free circuit and their distributions. The model allows fault abstraction of physical defects through structural fault modeling and perturbation estimation. The fault simulation technique uses a linear estimation of the faulty and fault-free output circuits. Techniques for fault observation and propagation are presented in order to build a hierarchical analog fault simulator.