How to model and simulate microgyroscope systems
IEEE Spectrum
A modeling approach to include mechanical microsystem components into the system simulation
Proceedings of the conference on Design, automation and test in Europe
Microsystems testing: an approach and open problems
Proceedings of the conference on Design, automation and test in Europe
Hierarchical Design and Test of Integrated Microsystems
IEEE Design & Test
Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal ICs
Proceedings of the IEEE International Test Conference on Test and Design Validity
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis
Proceedings of the IEEE International Test Conference
MEMS fault model generation using CARAMEL
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A perturbation based fault modeling and simulation for mixed-signal circuits
ATS '97 Proceedings of the 6th Asian Test Symposium
Electro-thermal Stimuli for MEMS Testing in FSBM Technology
Journal of Electronic Testing: Theory and Applications
Built-in-self-test techniques for MEMS
Microelectronics Journal
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
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