SWITTEST: automatic switch-level fault simulation and test evaluation of switched-capacitor systems
DAC '97 Proceedings of the 34th annual Design Automation Conference
A fault simulation methodology for MEMS
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Switch-level fault coverage analysis for switch-capacitor systems
Proceedings of the conference on Design, automation and test in Europe
An approach to realistic fault prediction and layout design for testability in analog circuits
Proceedings of the conference on Design, automation and test in Europe
A new quality estimation methodology for mixed-signal and analogue ICs
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Defect-based test optimization for analog/RF circuits for near-zero DPPM applications
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Automated model generation algorithm for high-level fault modeling
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor
Journal of Electronic Testing: Theory and Applications
Hi-index | 0.00 |