Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal ICs

  • Authors:
  • Thomas Olbrich;Jordi Pérez;Ian A. Grout;Andrew M. D. Richardson;Carles Ferrer

  • Affiliations:
  • -;-;-;-;-

  • Venue:
  • Proceedings of the IEEE International Test Conference on Test and Design Validity
  • Year:
  • 1996

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Abstract