Fault macromodeling and a testing strategy for opamps
Journal of Electronic Testing: Theory and Applications
Fault Modeling and Simulation Using VHDL-AMS
Analog Integrated Circuits and Signal Processing - Special issue: Analog VHDL
System identification (2nd ed.): theory for the user
System identification (2nd ed.): theory for the user
Neural Networks: A Comprehensive Foundation
Neural Networks: A Comprehensive Foundation
Industrial Applications of Fuzzy Technology
Industrial Applications of Fuzzy Technology
Digital Control and Estimation: A Unified Approach
Digital Control and Estimation: A Unified Approach
Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal ICs
Proceedings of the IEEE International Test Conference on Test and Design Validity
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Piecewise polynomial nonlinear model reduction
Proceedings of the 40th annual Design Automation Conference
ETW '01 Proceedings of the IEEE European Test Workshop (ETW'01)
Behavioral Fault Modeling and Simulation Using VHDL-AMS to Speed-Up Analog Fault Simulation
Analog Integrated Circuits and Signal Processing
An Essentially Non-Oscillatory (ENO) high-order accurate Adaptive table model for device modeling
Proceedings of the 41st annual Design Automation Conference
Journal of Electronic Testing: Theory and Applications
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High-level modeling for operational amplifiers (opamps) has been previously carried out successfully using models generated by published automated model generation approaches. Furthermore, high-level fault modeling (HLFM) has been shown to work reasonably well using manually designed fault models. However, no evidence shows that published automated model generation approaches based on opamps have been used in HLFM. This paper describes HLFM for analog circuits using an adaptive self-tuning algorithm called multiple model generation system using delta. The generation algorithms and simulation models were written in MATLAB and the hardware description language VHDL-AMS, respectively. The properties of these self-tuning algorithms were investigated by modeling complementary metal-oxide-semiconductor opamps, and comparing simulations using the HLFM against those of the original simulation program with integrated circuit emphasis circuit utilizing transient analysis. Results show that the models can handle both linear and nonlinear fault situations with better accuracy than previously published HLFMs.