Fault Models and Test Generation for OpAmp Circuits—The FFM
Journal of Electronic Testing: Theory and Applications
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Fault Macromodeling for Analog/Mixed-Signal Circuits
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Automated model generation algorithm for high-level fault modeling
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Journal of Electronic Testing: Theory and Applications
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