Stochastic finite elements: a spectral approach
Stochastic finite elements: a spectral approach
Analytical fault modeling and static test generation for analog ICs
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Parametric fault simulation and test vector generation
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations
Journal of Electronic Testing: Theory and Applications
Modeling Within-Die Spatial Correlation Effects for Process-Design Co-Optimization
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Robust extraction of spatial correlation
Proceedings of the 2006 international symposium on Physical design
Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
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A new approach for structural, fault-oriented analog test generation methodology to test for the presence of manufacturing-related defects is proposed. The output of the test generator consists of optimized test stimuli, fault coverage and sampling instants that are sufficient to detect the failure modes in the circuit under test. The tests are generated and evaluated on a multistep ADC taking into account the potential fault masking effects of process spread on the faulty circuit responses. Similarly, the test generator results offer indication for the circuit partitioning within the framework of circuit performance, area and testability.