RF microelectronics
Defect-oriented testing of mixed-signal ICs: some industrial experience
ITC '98 Proceedings of the 1998 IEEE International Test Conference
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Mixed Loopback BiST for RF Digital Transceivers
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
IEEE Communications Magazine
An on-chip loopback block for RF transceiver built-in test
IEEE Transactions on Circuits and Systems II: Express Briefs
Multiband RF-sampling receiver front-end with on-chip testability in 0.13 µm CMOS
Analog Integrated Circuits and Signal Processing
Built-in loopback test for IC RF transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
RF on-chip test by reconfiguration technique
ICC'06 Proceedings of the 10th WSEAS international conference on Circuits
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In this paper we present two designs of CMOS blocks suitable for integration with RF frontend blocks for test purposes. Those are a programmable RF test attenuator and a reconfigurable low noise amplifier (LNA), optimized with respect to their function and location in the circuit. We discuss their performances in terms of the test- and normal operation mode. The presented application model aims at a transceiver under loopback test with enhanced controllability and detectability. The circuits are designed for 0.35驴m CMOS process. Simulation results of the receiver frontend operating in 2.4 GHz band are presented showing tradeoffs between the performance and test functionality.