Testability Implications in Low-cost Integrated Radio Transceivers: A Bluetooth Case Study
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Boundary Scan for 5-GHz RF Pins Using LC Isolation Networks
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Low Cost On-Line Testing Strategy for RF Circuits
Journal of Electronic Testing: Theory and Applications
Efficient loop-back testing of on-chip ADCs and DACs
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
CMOS blocks for on-chip RF test
Analog Integrated Circuits and Signal Processing
Towards Fault-Tolerant RF Front Ends
Journal of Electronic Testing: Theory and Applications
Interactive presentation: Boosting SER test for RF transceivers by simple DSP technique
Proceedings of the conference on Design, automation and test in Europe
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry
Proceedings of the conference on Design, automation and test in Europe
Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Built-in loopback test for IC RF transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
RF on-chip test by reconfiguration technique
ICC'06 Proceedings of the 10th WSEAS international conference on Circuits
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures
Journal of Electronic Testing: Theory and Applications
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An architecture for system-level self-test of a wireless communication transceiver integrates the functional (parametric) self-test of the radio frequency subsystem, and the structural self-test of the digital subsystem. The digital subsystem is tested using extensions of the IEEE 1149.1 boundary scan standard to verify connections within circuit boards and between boards. The RF subsystem is tested using a loopback connection between the RF transmitter and receiver. An RF parametric self-test is performed using a digitally modulated signal (as opposed to a sinusoidal tone) as the test stimulus, and using samples from the receiver digitizer as test data. This loopback test scheme imposes a relatively small overhead on the RF system design