End-to-End Test Strategy for Wireless Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
IEEE Communications Magazine
Low Cost Analog Testing of RF Signal Paths
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
A Built-In Self-Test Scheme for Differential Ring Oscillators
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
On-Chip Testing Techniques for RF Wireless Transceivers
IEEE Design & Test
Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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As use of wireless communications rises and profit margins shrink, low-cost solutions are becoming increasingly important. Incorporating test design and DFT into the system design flow is essential to achieving such solutions. This case study analyzes test requirements, implications, and test cost for low-cost Bluetooth systems, which enable communication among several electronic components.