End-to-End Test Strategy for Wireless Systems

Improving Design and Fault Detection inLinear and Nonlinear High Frequency Circuits byPerforming a Sensitivity Based Analysis

Analog Integrated Circuits and Signal Processing

Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers

IEEE Design & Test

Testability Implications in Low-cost Integrated Radio Transceivers: A Bluetooth Case Study

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Low Cost Analog Testing of RF Signal Paths

Proceedings of the conference on Design, automation and test in Europe - Volume 1

Boundary Scan for 5-GHz RF Pins Using LC Isolation Networks

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications

Journal of Electronic Testing: Theory and Applications

Low Cost On-Line Testing Strategy for RF Circuits

Journal of Electronic Testing: Theory and Applications

An improved RF loopback for test time reduction

Proceedings of the conference on Design, automation and test in Europe: Proceedings

On-Chip Testing Techniques for RF Wireless Transceivers

IEEE Design & Test

Towards Fault-Tolerant RF Front Ends

Journal of Electronic Testing: Theory and Applications

Reducing Test Time Using an Enhanced RF Loopback

Journal of Electronic Testing: Theory and Applications

Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

An on-chip loopback block for RF transceiver built-in test

IEEE Transactions on Circuits and Systems II: Express Briefs

System-level specification testing of wireless transceivers

IEEE Transactions on Very Large Scale Integration (VLSI) Systems