RF microelectronics
System chip test: how will it impact your design?
Proceedings of the 37th Annual Design Automation Conference
End-to-End Test Strategy for Wireless Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Bulti-in Self-Test Strategy for Wireless Communication Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
Low Cost Analog Testing of RF Signal Paths
Proceedings of the conference on Design, automation and test in Europe - Volume 1
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Mixed Loopback BiST for RF Digital Transceivers
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
A CMOS RF RMS Detector for Built-in Testing of Wireless Transceivers
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
Use of Embedded Sensors for Built-In-Test of RF Circuits
ITC '04 Proceedings of the International Test Conference on International Test Conference
Reducing Test Time Using an Enhanced RF Loopback
Journal of Electronic Testing: Theory and Applications
An on-chip loopback block for RF transceiver built-in test
IEEE Transactions on Circuits and Systems II: Express Briefs
Journal of Electronic Testing: Theory and Applications
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In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources in order to minimize the test overhead. An RF sampler is used to observe spectral characteristics of the RF signal path during loopback operation. While able to improve the observability of the signal path, the method also allows faster diagnosis than conventional loopback tests, as the number of transmitted symbols can be greatly reduced. Practical results for a prototyped RF link at 860MHz are presented in order to demonstrate the relevance of the method.