A Bulti-in Self-Test Strategy for Wireless Communication Systems

Metrics, techniques and recent developments in mixed-signal testing

Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design

Improving Design and Fault Detection inLinear and Nonlinear High Frequency Circuits byPerforming a Sensitivity Based Analysis

Analog Integrated Circuits and Signal Processing

Low Cost Analog Testing of RF Signal Paths

Proceedings of the conference on Design, automation and test in Europe - Volume 1

Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST

SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design

Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications

Journal of Electronic Testing: Theory and Applications

Low Cost On-Line Testing Strategy for RF Circuits

Journal of Electronic Testing: Theory and Applications

An improved RF loopback for test time reduction

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Low-cost testing of 5 GHz low noise amplifiers using new RF BIST circuit

Journal of Electronic Testing: Theory and Applications

A Novel RF Test Scheme Based on a DFT Method

Journal of Electronic Testing: Theory and Applications

Reducing Test Time Using an Enhanced RF Loopback

Journal of Electronic Testing: Theory and Applications

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability

An on-chip loopback block for RF transceiver built-in test

IEEE Transactions on Circuits and Systems II: Express Briefs

Built-in loopback test for IC RF transceivers

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

System-level specification testing of wireless transceivers

IEEE Transactions on Very Large Scale Integration (VLSI) Systems