RF microelectronics
System chip test: how will it impact your design?
Proceedings of the 37th Annual Design Automation Conference
End-to-End Test Strategy for Wireless Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Bulti-in Self-Test Strategy for Wireless Communication Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
Low Cost Analog Testing of RF Signal Paths
Proceedings of the conference on Design, automation and test in Europe - Volume 1
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Mixed Loopback BiST for RF Digital Transceivers
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
A CMOS RF RMS Detector for Built-in Testing of Wireless Transceivers
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
Low Cost On-Line Testing Strategy for RF Circuits
Journal of Electronic Testing: Theory and Applications
Use of Embedded Sensors for Built-In-Test of RF Circuits
ITC '04 Proceedings of the International Test Conference on International Test Conference
An improved RF loopback for test time reduction
Proceedings of the conference on Design, automation and test in Europe: Proceedings
RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate
Journal of Electronic Testing: Theory and Applications
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This work presents a method to improve the loopback test used in RF transceivers. The approach is targeted to the System-On-Chip environment, being able to reuse system resources in order to minimize the test overhead. An RF sampler is used during loopback operation, allowing observation of spectral characteristics of the RF signal. While able to improve the overall observability of the RF signal path, faster diagnosis than conventional loopback tests is achieved thanks to a large reduction in the number of transmitted symbols. Theoretical analysis and practical results for a prototype transceiver operating at 846 MHz are presented. It is shown that a significant test time reduction is achievable considering bit error rate tests for common digital modulation schemes.